SpotOn位敏探测系统新势力光电供应SpotOn位敏探测系统，光谱范围350-1100nm 、位置精度±0.1um或者光束尺寸±0.025%。该系列位敏探测系统用于测量：激光中心/位移/功率的测量、光学系统准直及品质控制、旋转及位移的测量、平面度及准直性的校准、振动及缺陷的监控。Model Descripti** SPOTUSB-L Lateral effect PnP 9mm×9mm, no glass cover SPOTUSB-N Lateral effect PnP 10mm×10mm, with glass cover SPOTUSB-Q Four quadrant PnP 10mm×10mm, with 30um gap, no glass cover SPOTUSB-U Four quadrant PnP 10mm×10mm, with 10um gap, with glass cover SPOTON-LA Large aperture, 135mm×100mm, 400-800nm Optional heads L44 Lateral effect PnP, usable beam size<25mm L18 Lateral effect PnP 18mm×18mm, with glass cover L4 Lateral effect PnP 4mm×4mm, no glass cover Optional accessories NG4 ND filter in housing (3/4"-32 thread) NG9 ND filter in housing (3/4"-32 thread) NG10 ND filter in housing (3/4"-32 thread) Hood 55mm long, for ambient light suppression
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