SpotOn位敏探测系统
SpotOn位敏探测系统
新势力光电供应SpotOn位敏探测系统,光谱范围350-1100nm 、位置精度±0.1um或者光束尺寸±0.025%。该系列位敏探测系统用于测量:激光中心/位移/功率的测量、光学系统准直及品质控制、旋转及位移的测量、平面度及准直性的校准、振动及缺陷的监控。
Model Descripti**
SPOTUSB-L Lateral effect PnP 9mm×9mm, no glass cover
SPOTUSB-N Lateral effect PnP 10mm×10mm, with glass cover
SPOTUSB-Q Four quadrant PnP 10mm×10mm, with 30um gap, no glass cover
SPOTUSB-U Four quadrant PnP 10mm×10mm, with 10um gap, with glass cover
SPOTON-LA Large aperture, 135mm×100mm, 400-800nm
Optional heads
L44 Lateral effect PnP, usable beam size<25mm
L18 Lateral effect PnP 18mm×18mm, with glass cover
L4 Lateral effect PnP 4mm×4mm, no glass cover
Optional accessories
NG4 ND filter in housing (3/4"-32 thread)
NG9 ND filter in housing (3/4"-32 thread)
NG10 ND filter in housing (3/4"-32 thread)
Hood 55mm long, for ambient light suppression